arXiv · 0704.2330
CdZnTe:Cl crystals for X-ray computer tomography detectors
Abstract
Processes of growth of semi-insulating Cd(1-x)Zn(x)Te:Cl crystals (x = 0.0002 and 0.1) of n-type conductivity are investigated. From the grown crystals detectors for X-ray computer tomography with small value of photocurrent memory (afterglow) (0.1-0.3%) are obtained.
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O. A. Matveev, A. I. Terent'ev, V. P. Karpenko, N. K. Zelenina, A. Fauler, M. Federle, K. W. Benz. 2007-04-18. CdZnTe:Cl crystals for X-ray computer tomography detectors. https://arxiv.org/abs/0704.2330
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