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arXiv · 0710.4735

Worst-Case and Average-Case Analysis of n-Detection Test Sets

Irith Pomeranz·Sudhakar M. Reddy
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Abstract

Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform both a worst-case analysis and an average-case analysis to check the effect of restricting n on the unmodeled fault coverage of an (arbitrary) n-detection test set. Our analysis is independent of any particular test set or test generation approach. It is based on a specific set of target faults and a specific set of untargeted faults. It shows that, depending on the circuit, very large values of n may be needed to guarantee the detection of all the untargeted faults. We discuss the implications of these results.

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Irith Pomeranz, Sudhakar M. Reddy. 2007-10-25. Worst-Case and Average-Case Analysis of n-Detection Test Sets. https://arxiv.org/abs/0710.4735

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