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arXiv · 0802.2119

Direct evidence for the suppression of charge stripes in epitaxial La$_{1.67}$Sr$_{0.33}$NiO$_4$ thin films

C. K. Xie·J. I. Budnick·W. A. Hines·B. O. Wells·Feizhou He·A. R. Moodenbaugh
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Abstract

We have successfully grown epitaxial La$_{1.67}$Sr$_{0.33}$NiO$_4$ films with a small crystalline mosaic using pulsed laser deposition. With synchrotron radiation, the x-ray diffraction peaks associated with charge stripes have been successfully observed for relatively thick films. Anomalies due to the charge-ordering transition have been examined using four-point probe resistivity measurements. X-ray scattering provides direct evidence for suppression of the stripe phase in thin samples; the phase disappears for film thicknesses $\leqslant$ 2600 ~Å. The suppression appears to be a result of shrinking the stripe phase domains. This may reflect the stripe phase progressing from nematic to isotropic.

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C. K. Xie, J. I. Budnick, W. A. Hines, B. O. Wells, Feizhou He, A. R. Moodenbaugh. 2008-02-14. Direct evidence for the suppression of charge stripes in epitaxial La$_{1.67}$Sr$_{0.33}$NiO$_4$ thin films. https://doi.org/10.1103/physrevb.77.201403

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