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arXiv · 0805.1543

Resonant inelastic x-ray scattering in electronically quasi-zero-dimensional CuB2O4

J. N. Hancock·G. Chabot-Couture·Y. Li·G. Petrakovskii·K. Ishii·I. Jarrige·J. Mizuki·T. P. Devereaux·M. Greven
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Abstract

We explore the general phenomenology of resonant inelastic scattering (RIXS) using CuB2O4, a network of CuO4 plaquettes electronically isolated by B+3 ions. Spectra show a small number of well-separated features, and we exploit the simple electronic structure to explore RIXS phenomenology by developing a calculation which allows for intermediate-state effects ignored in standard approaches. These effects are found to be non-negligible and good correspondence between our model and experiment leads to a simple picture of such phenomenology as the genesis of d-d excitations at the K edge and intermediate-state interference effects.

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J. N. Hancock, G. Chabot-Couture, Y. Li, G. Petrakovskii, K. Ishii, I. Jarrige, J. Mizuki, T. P. Devereaux, M. Greven. 2010-04-01. Resonant inelastic x-ray scattering in electronically quasi-zero-dimensional CuB2O4. https://doi.org/10.1103/physrevb.80.092509

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