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arXiv · 0805.2269

Near-edge x-ray absorption fine structure investigation of graphene

D. Pacilé·M. Papagno·A. Fraile Rodríguez·M. Grioni·L. Papagno·Ç. Ö. Girit·J. C. Meyer·G. E. Begtrup·A. Zettl
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Abstract

We report the near-edge x-ray absorption fine structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of Highly Ordered Pyrolytic Graphite (HOPG) on a SiO2 substrate. We utilized a PhotoEmission Electron Microscope (PEEM) to separately study single- double- and few-layers graphene (FLG) samples. In single-layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

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D. Pacilé, M. Papagno, A. Fraile Rodríguez, M. Grioni, L. Papagno, Ç. Ö. Girit, J. C. Meyer, G. E. Begtrup, A. Zettl. 2008-05-15. Near-edge x-ray absorption fine structure investigation of graphene. https://doi.org/10.1103/physrevlett.101.066806

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