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arXiv · 0807.4370

Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films

C. Grygiel·A. Pautrat·W. C. Sheets·W. Prellier·B. Mercey·L. Mechin
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Abstract

The spectacular metal-to-insulator transition of V2O3 can be progressively suppressed in thin film samples. Evidence for phase separation was observed using microbridges as a mesoscopic probe of transport properties where the same film possesses domains that exhibit a metal-to-insulator transition with clear first order features or remain metallic down to low temperatures. A simple model consisting of two parallel resistors can be used to quantify a phase coexistence scenario explaining the measured macroscopic transport properties. The interaction between film and substrate is the most plausible candidate to explain this extended phase coexistence as shown by a correlation between the transport properties and the structural data.

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C. Grygiel, A. Pautrat, W. C. Sheets, W. Prellier, B. Mercey, L. Mechin. 2008-10-23. Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films. https://doi.org/10.1088/0953-8984/20/47/472205

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