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arXiv · 0811.1379

Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

Jungho Kim·D. S. Ellis·H. Zhang·J. P. Hill·F. C. Chou·T. Gog·D. Casa·Young-June Kim
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Abstract

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi$_2$CuO$_4$, CuGeO$_3$, Sr$_2$Cu$_3$O$_4$Cl$_2$, La$_2$CuO$_4$, and Sr$_2$CuO$_2$Cl$_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi$_2$CuO$_4$ and CuGeO$_3$.

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Jungho Kim, D. S. Ellis, H. Zhang, J. P. Hill, F. C. Chou, T. Gog, D. Casa, Young-June Kim. 2008-11-09. Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides. https://doi.org/10.1103/physrevb.79.094525

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