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arXiv · 0811.3167

Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films

Z. Z. Li·V. Jovanovic·H. Raffy·S. Megtert
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Abstract

Single phase, c-axis oriented, e-doped, Sr1-xLaxCuO2 thin films were epitaxially grown on KTaO3 and DyScO3 substrates by reactive rf sputtering. As-grown films being insulating due to oxygen excess, oxygen reduction is necessary to observe superconductivity. Two different procedures were employed to reach superconductivity. On one hand an in-situ reduction process was conducted on a series of films deposited on both types of substrates. On the other hand, an ex-situ reduction procedure was performed sequentially on a single film deposited on DyScO3. The study of the influence of oxygen reduction on the structural and electronic properties of the thin films is presented and discussed.

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Z. Z. Li, V. Jovanovic, H. Raffy, S. Megtert. 2008-11-19. Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films. https://doi.org/10.1016/j.physc.2008.11.006

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