arXiv · 0812.0282
Measurement of the shot noise in a single electron transistor
Abstract
We have systematically measured the shot noise in a single electron transistor (SET) as a function of bias and gate voltages. By embedding a SET in a resonance circuit we have been able to measure its shot noise at the resonance frequency 464 MHz, where the 1/f noise is negligible. We can extract the Fano factor which varies between 0.5 and 1 depending on the amount of Coulomb blockade in the SET, in very good agreement with the theory.
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Sergey Kafanov, Per Delsing. 2008-12-01. Measurement of the shot noise in a single electron transistor. https://doi.org/10.1103/physrevb.80.155320
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