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arXiv · 0812.2823

Lifetime statistics in chaotic dielectric microresonators

Henning Schomerus·Jan Wiersig·Jörg Main
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Abstract

We discuss the statistical properties of lifetimes of electromagnetic eigenmodes in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of anomalously short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance trapping phenomenon.

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Henning Schomerus, Jan Wiersig, Jörg Main. 2008-12-15. Lifetime statistics in chaotic dielectric microresonators. https://doi.org/10.1103/physreva.79.053806

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