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arXiv · 0901.0533

High fidelity transport of trapped-ion qubits through an X-junction trap array

R. B. Blakestad·C. Ospelkaus·A. P. VanDevender·J. M. Amini·J. Britton·D. Leibfried·D. J. Wineland
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Abstract

We report reliable transport of 9Be+ ions through a 2-D trap array that includes a separate loading/reservoir zone and an "X-junction". During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency (RF) noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.

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R. B. Blakestad, C. Ospelkaus, A. P. VanDevender, J. M. Amini, J. Britton, D. Leibfried, D. J. Wineland. 2009-03-30. High fidelity transport of trapped-ion qubits through an X-junction trap array. https://doi.org/10.1103/physrevlett.102.153002

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