Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface

C. Bell; S. Harashima; Y. Hikita; H. Y. Hwang

doi:10.1063/1.3149695

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arXiv · 0902.3535

Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface

C. Bell·S. Harashima·Y. Hikita·H. Y. Hwang

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Abstract

The electronic transport properties of a series of LaAlO_3 / SrTiO_3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend occurs above the critical thickness of four unit cells, below which the LaAlO_3 / SrTiO_3 interface is not conducting. A dramatic decrease in mobility of the electron gas of nearly two orders of magnitude was observed with increasing LaAlO_3 thickness from five to 25 unit cells.

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C. Bell, S. Harashima, Y. Hikita, H. Y. Hwang. 2009-02-20. Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface. https://doi.org/10.1063/1.3149695

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