arXiv · 0905.2941
Disordered Electrical Potential Observed on the Surface of SiO$_2$ by Electric Field Microscopy
Abstract
The electrical potential on the surface of $\sim 300$ nm thick SiO$_2$ grown on single crystalline Si substrates has been characterized at ambient conditions using electric field microscopy. Our results show an inhomogeneous potential distribution with fluctuations up to $\sim 0.4 $V within regions of $1 \mu$m. The potential fluctuations observed at the surface of these usual dielectric holders of graphene sheets should induce strong variations in the graphene charge densities and provide a simple explanation for some of the anomalous behaviors of the transport properties of graphene.
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N. García, Zang Yan, A. Ballestar, J. Barzola-Quiquia, F. Bern, P. Esquinazi. 2009-05-18. Disordered Electrical Potential Observed on the Surface of SiO$_2$ by Electric Field Microscopy. https://doi.org/10.1088/0953-8984/22/4/045002
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