arXiv · 0910.1218
Tuning of electron transport through a moebius strip: shot noise
Abstract
We explore electron transport through a moebius strip attached to two metallic electrodes by the use of Green's function technique. A parametric approach is used based on the tight-binding model to characterize the electron transport through such a bridge system and it is observed that the transport properties are significantly affected by (a) the transverse hopping strength between the two channels and (b) the strip-to-electrode coupling strength. In this context we also describe the noise power of the current fluctuations that provides a key information about the electron correlation which is obtained by calculating the Fano factor ($F$). The knowledge of this current fluctuations gives important ideas for fabrication of efficient electronic devices.
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Santanu K. Maiti. 2009-10-07. Tuning of electron transport through a moebius strip: shot noise. https://doi.org/10.1016/j.ssc.2007.03.013
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