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arXiv · 0910.5452

Preparation of Cobalt Thin Films by Sputtering Systems and Its Magnetic Characterization

Mustafa Erkovan
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Abstract

Different thicknesses of cobalt thin films were growth by magnetron sputtering deposition techniques. The films thicknesses were determinated with X ray Photoelectron Spectroscopy (XPS) and Quartz Crystal Monitoring (QCM). XPS is also used to determinate the films quality. The films magnetic properties were determinated by Ferromagnetic Resonance (FMR) technique.

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Mustafa Erkovan. 2009-10-28. Preparation of Cobalt Thin Films by Sputtering Systems and Its Magnetic Characterization. https://arxiv.org/abs/0910.5452

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