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arXiv · 1002.2422

Resonant escape over an oscillating barrier in single-electron ratchet transfer

Satoru Miyamoto·Katsuhiko Nishiguchi·Yukinori Ono·Kohei M. Itoh·Akira Fujiwara
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Abstract

Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.

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Satoru Miyamoto, Katsuhiko Nishiguchi, Yukinori Ono, Kohei M. Itoh, Akira Fujiwara. 2010-02-11. Resonant escape over an oscillating barrier in single-electron ratchet transfer. https://doi.org/10.1103/physrevb.82.033303

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