arXiv · 1008.1486
Charge Detection in Phosphorus-doped Silicon Double Quantum Dots
Abstract
We report charge detection in degenerately phosphorus-doped silicon double quantum dots (DQD) electrically connected to an electron reservoir. The sensing device is a single electron transistor (SET) patterned in close proximity to the DQD. Measurements performed at 4.2K show step-like behaviour and shifts of the Coulomb Blockade oscillations in the detector's current as the reservoir's potential is swept. By means of a classical capacitance model, we demonstrate that the observed features can be used to detect single-electron tunnelling from, to and within the DQD, as well as to reveal the DQD charge occupancy.
Explore related subjects
Keep this discovery
A. Rossi, T. Ferrus, G. J. Podd, D. A. Williams. 2010-08-09. Charge Detection in Phosphorus-doped Silicon Double Quantum Dots. https://doi.org/10.1063/1.3524490
Cite the original work for its findings. Save a collection to share your selection of sources.