arXiv · 1010.0571
In vacancies in InN grown by plasma-assisted molecular beam epitaxy
Abstract
The authors have applied positron annihilation spectroscopy to study the effect of different growth conditions on vacancy formation in In- and N-polar InN grown by plasma-assisted molecular beam epitaxy. The results suggest that the structural quality of the material and limited diffusion of surface adatoms during growth dictate the In vacancy formation in low electron-density undoped epitaxial InN, while growth conditions and thermodynamics have a less important role, contrary to what is observed in, e.g., GaN. Further, the results imply that in high quality InN, the electron mobility is likely limited not by ionized point defect scattering, but rather by threading dislocations.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Floris Reurings, Filip Tuomisto, Chad S. Gallinat, Gregor Koblmüller, James S. Speck. 2010-10-04. In vacancies in InN grown by plasma-assisted molecular beam epitaxy. https://doi.org/10.1063/1.3516467
Cite the original work for its findings. Save a collection to share your selection of sources.