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arXiv · 1010.3565

Determining the Electron-Phonon Coupling Strength in Correlated Electron Systems from Resonant Inelastic X-ray Scattering

Luuk J. P. Ament·Michel van Veenendaal·Jeroen van den Brink
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Abstract

We show that high resolution Resonant Inelastic X-ray Scattering (RIXS) provides direct, element-specific and momentum-resolved information on the electron-phonon (e-p) coupling strength. Our theoretical analysis demonstrates that the e-p coupling can be extracted from RIXS spectra by determining the differential phonon scattering cross section. An alternative, very direct manner to extract the coupling is to use the one and two-phonon loss ratio, which is governed by the e-p coupling strength and the core-hole life-time. This allows measurement of the e-p coupling on an absolute energy scale.

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Luuk J. P. Ament, Michel van Veenendaal, Jeroen van den Brink. 2010-10-18. Determining the Electron-Phonon Coupling Strength in Correlated Electron Systems from Resonant Inelastic X-ray Scattering. https://doi.org/10.1209/0295-5075%2F95%2F27008

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