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arXiv · 1101.4709

Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States

E. Iyoda·T. Fujii
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Abstract

We investigate shot noise at {\it finite temperatures} induced by the quasi-particle tunneling between fractional quantum Hall (FQH) edge states. The resulting Fano factor has the peak structure at a certain bias voltage. Such a structure indicates that quasi-particles are weakly {\it glued} due to thermal fluctuation. We show that the effect makes it possible to probe the difference of statistics between $ν=1/5,{}2/5$ FQH states where quasi-particles have the same unit charge.Finally we propose a way to indirectly obtain statistical angle in hierarchical FQH states.

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E. Iyoda, T. Fujii. 2012-04-09. Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States. https://doi.org/10.1143/jpsj.80.073709

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