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arXiv · 1104.2552

Single-qubit-gate error below 10^-4 in a trapped ion

K. R. Brown·A. C. Wilson·Y. Colombe·C. Ospelkaus·A. M. Meier·E. Knill·D. Leibfried·D. J. Wineland
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Abstract

With a 9Be+ trapped-ion hyperfine-states qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2) x 10^-5, below the threshold estimate of 10^-4 commonly considered sufficient for fault-tolerant quantum computing. The 9Be+ ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

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K. R. Brown, A. C. Wilson, Y. Colombe, C. Ospelkaus, A. M. Meier, E. Knill, D. Leibfried, D. J. Wineland. 2011-04-13. Single-qubit-gate error below 10^-4 in a trapped ion. https://doi.org/10.1103/physreva.84.030303

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