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arXiv · 1106.1737

MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy

A. S. Shkvarin·Yu. M. Yarmoshenko·M. V. Yablonskikh·N. A. Skorikov·A. I. Merentsov·A. N. Titov
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Abstract

Electronic structure and chemical bonding in TiX2 (X=S, Se, Te), TMxTiSe2 (TM=Cr, Mn, Cu) and CrxTi1-xSe2 were studied by x-ray resonance photoemission and absorption spectroscopy. These methods are detected to be strong sensitive to chemical bonding. Charge transfer from the intercalated atoms to Ti 3d band is detected. Narrow Ti 3d and Cu 3d bands are observed under Fermi level in CuxTiSe2.

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A. S. Shkvarin, Yu. M. Yarmoshenko, M. V. Yablonskikh, N. A. Skorikov, A. I. Merentsov, A. N. Titov. 2011-06-09. MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy. https://doi.org/10.1016/j.jpcs.2012.04.012

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