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arXiv · 1108.3497

Fluctuation-induced tunneling conduction through RuO$_2$ nanowire contacts

Yong-Han Lin·Juhn-Jong Lin
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Abstract

A good understanding of the electronic conduction processes through nanocontacts is a crucial step for the implementation of functional nanoelectronic devices. We have studied the current-voltage ($I$-$V$) characteristics of nanocontacts between single metallic RuO$_2$ nanowires (NWs) and contacting Au electrodes which were pre-patterned by simple photolithography. Both the temperature behavior of contact resistance in the low-bias voltage ohmic regime and the $I$-$V$ curves in the high-bias voltage non-ohmic regime have been investigated. We found that the electronic conduction processes in the wide temperature interval 1--300 K can be well described by the fluctuation-induced tunneling (FIT) conduction theory. Taken together with our previous work (Lin {\it et al.}, Nanotechnology {\bf 19}, 365201 (2008)) where the nanocontacts were fabricated by delicate electron-beam lithography, our study demonstrates the general validity of the FIT model in characterizing electronic nanocontacts.

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Yong-Han Lin, Juhn-Jong Lin. 2011-08-17. Fluctuation-induced tunneling conduction through RuO$_2$ nanowire contacts. https://doi.org/10.1063/1.3638707

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