arXiv · 1201.1868
Scanning microscopies of superconductors at very low temperatures
Abstract
We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample's surface.
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V. Crespo, A. Maldonado, J. A. Galvis, P. Kulkarni, I. Guillamon, J. G. Rodrigo, H. Suderow, S. Vieira, S. Banerjee, P. Rodiere. 2012-01-09. Scanning microscopies of superconductors at very low temperatures. https://doi.org/10.1016/j.physc.2012.02.014
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