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arXiv · 1205.4149

Controlling exchange coupling strength in NixCu100-x thin films

B. Nagy·Yu. N. Khaydukov·L. F. Kiss·Sz. Sajti·D. G. Merkel·F. Tanczikó·A. S. Vasenko·R. O. Tsaregorodsev·A. Rühm·T. Keller·L. Bottyán
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Abstract

Thickness (dF) and concentration (x) dependence of the Curie temperature of NixCu100-x(dF) ferromagnetic alloy layers (x =0.55,0.65, dF =[3nm{\div}12nm]) being in contact with a vanadium layer was studied. The Curie temperature of the ferromagnetic layers depends on the thickness when it is comparable with the interface layer between the F and the vanadium layers, which is attributed to the proximity coupling of the interface region with the rest of the F layer. The present study provides valuable information for fabrication of samples with controlled exchange coupling strength for studies of superconductor/ferromagnet (S/F) proximity effects.

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B. Nagy, Yu. N. Khaydukov, L. F. Kiss, Sz. Sajti, D. G. Merkel, F. Tanczikó, A. S. Vasenko, R. O. Tsaregorodsev, A. Rühm, T. Keller, L. Bottyán. 2012-05-18. Controlling exchange coupling strength in NixCu100-x thin films. https://arxiv.org/abs/1205.4149

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