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arXiv · 1209.0892

Analysis of the 3D distribution of self-assembled stacked quantum dots by electron tomography

Jesús Hernández-Saz·Miriam Herrera·Diego Alonso-Álvarez·Sergio I. Molina
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Abstract

This paper has been withdrawn by the authors. The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shape specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only a 3D analysis allows an accurate correlation between the growth design and the structural characteristics.

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Jesús Hernández-Saz, Miriam Herrera, Diego Alonso-Álvarez, Sergio I. Molina. 2012-10-24. Analysis of the 3D distribution of self-assembled stacked quantum dots by electron tomography. https://arxiv.org/abs/1209.0892

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