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arXiv · 1210.3093

Pseudogap-related charge dynamics in layered-nickelate R2-xSrxNiO4 (x sim 1)

M. Uchida·Y. Yamasaki·Y. Kaneko·K. Ishizaka·J. Okamoto·H. Nakao·Y. Murakami·Y. Tokura
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Abstract

Charge dynamics and its critical behavior are investigated near the metal-insulator transition of layered-nickelate R2-xSrxNiO4 (R=Nd, Eu). The polarized x-ray absorption spectroscopy experiment clearly shows the multi-orbital nature which enables the x2-y2-orbital-based checkerboard-type charge ordering or correlation to persist up to the critical doping region (x sim 1). In the barely metallic region proximate to the charge-ordered insulating phase, the nominal carrier density estimated from the Hall coefficient markedly decreases in accord with development of the pseudogap structure in the optical conductivity spectrum, while the effective mass is least enhanced. The present findings combined with the results of recent angle-resolved photoemission spectroscopy show that the pseudogap in the metal-insulator critical state evolves due to the checkerboard-type charge correlation to extinguish the coherent-motion carriers in a characteristic momentum (k)-dependent manner with lowering temperature.

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M. Uchida, Y. Yamasaki, Y. Kaneko, K. Ishizaka, J. Okamoto, H. Nakao, Y. Murakami, Y. Tokura. 2012-10-11. Pseudogap-related charge dynamics in layered-nickelate R2-xSrxNiO4 (x sim 1). https://doi.org/10.1103/physrevb.86.165126

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