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arXiv · 1301.6631

Measuring the Casimir force gradient from graphene on a SiO_2 substrate

A. A. Banishev·H. Wen·J. Xu·R. K. Kawakami·G. L. Klimchitskaya·V. M. Mostepanenko·U. Mohideen
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Abstract

The gradient of the Casimir force between a Si-SiO${}_2$-graphene substrate and an Au-coated sphere is measured by means of a dynamic atomic force microscope operated in the frequency shift technique. It is shown that the presence of graphene leads to up to 9% increase in the force gradient at the shortest separation considered. This is in qualitative agreement with the predictions of an additive theory using the Dirac model of graphene.

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A. A. Banishev, H. Wen, J. Xu, R. K. Kawakami, G. L. Klimchitskaya, V. M. Mostepanenko, U. Mohideen. 2013-01-28. Measuring the Casimir force gradient from graphene on a SiO_2 substrate. https://doi.org/10.1103/physrevb.87.205433

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