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arXiv · 1302.0021

Multiple ionization of neon by soft X-rays at ultrahigh intensity

R Guichard·M Richter·J-M Rost·U Saalmann·A A Sorokin·K Tiedtke
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Abstract

At the free-electron laser FLASH, multiple ionization of neon atoms was quantitatively investigated at 93.0 eV and 90.5 eV photon energy. For ion charge states up to 6+, we compare the respective absolute photoionization yields with results from a minimal model and an elaborate description. Both approaches are based on rate equations and take into acccout a Gaussian spatial intensity distribution of the laser beam. From the comparison we conclude, that photoionization up to a charge of 5+ can be described by the minimal model. For higher charges, the experimental ionization yields systematically exceed the elaborate rate based prediction.

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R Guichard, M Richter, J-M Rost, U Saalmann, A A Sorokin, K Tiedtke. 2013-01-31. Multiple ionization of neon by soft X-rays at ultrahigh intensity. https://doi.org/10.1088/0953-4075%2F46%2F16%2F164025

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