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arXiv · 1302.5185

Finite-size effect in shot noise in hopping conduction

E. S. Tikhonov·V. S. Khrapai·D. V. Shovkun·D. Schuh
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Abstract

We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime.

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E. S. Tikhonov, V. S. Khrapai, D. V. Shovkun, D. Schuh. 2013-06-20. Finite-size effect in shot noise in hopping conduction. https://doi.org/10.1134/s0021364013150150

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