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arXiv · 1304.3472

Effect of charged line defects on conductivity in graphene: numerical Kubo and analytical Boltzmann approaches

T. M. Radchenko·A. A. Shylau·I. V. Zozoulenko·A. Ferreira
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Abstract

Charge carrier transport in single-layer graphene with one-dimensional charged defects is studied theoretically. Extended charged defects, considered an important factor for mobility degradation in chemically-vapor-deposited graphene, are described by a self-consistent Thomas-Fermi potential. A numerical study of electronic transport is performed by means of a time-dependent real-space Kubo approach in honeycomb lattices containing millions of carbon atoms, capturing the linear response of realistic size systems in the highly disordered regime. Our numerical calculations are complemented with a kinetic transport theory describing charge transport in the weak scattering limit. The semiclassical transport lifetimes are obtained by computing scattered amplitudes within the second Born approximation. The transport electron-hole asymmetry found in the semiclassical approach is consistent with the Kubo calculations. In the strong scattering regime, the conductivity is found to be a sublinear function of electronic density and weakly dependent on the Thomas-Fermi screening wavelength. We attribute this atypical behavior to the extended nature of one-dimensional charged defects. Our results are consistent with recent experimental reports.

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T. M. Radchenko, A. A. Shylau, I. V. Zozoulenko, A. Ferreira. 2013-04-11. Effect of charged line defects on conductivity in graphene: numerical Kubo and analytical Boltzmann approaches. https://doi.org/10.1103/physrevb.87.195448

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