Many Topological Insulators Fail the Surface Conduction Test

Sourabh Barua; K. P. Rajeev

doi:10.1063/1.4864058

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arXiv · 1304.4037

Many Topological Insulators Fail the Surface Conduction Test

Sourabh Barua·K. P. Rajeev

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Abstract

In this report, we scrutinize the thickness dependent resistivity data from the recent literature on electrical transport measurements in topological insulators. A linear increase in resistivity with increase in thickness is expected in the case of these materials since they have an insulating bulk and conducting surface. However, such a trend is not seen in the resistivity versus thickness data for all the cases examined, except for some samples, where it holds for a narrow range of thickness.

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Sourabh Barua, K. P. Rajeev. 2013-06-05. Many Topological Insulators Fail the Surface Conduction Test. https://doi.org/10.1063/1.4864058

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