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arXiv · 1304.5174

Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair

David T. Lloyd·Kevin O'Keeffe·Simon M. Hooker
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Abstract

We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.

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David T. Lloyd, Kevin O'Keeffe, Simon M. Hooker. 2013-04-18. Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair. https://doi.org/10.1364/ol.38.001173

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