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arXiv · 1308.5958

Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs

Matias Nordin·Christoffer Abrahamsson·Charlotte Hamngren Blomqvist·Magnus Röding·Eva Olsson·Magnus Nydén·Mats Rudemo
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Abstract

In this study we investigate the functional behavior of the intensity in high-angle annular dark field (HAADF) scanning transmission electron micrograph (STEM) images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a STEM micrograph. It also provides means for direct three-dimensional quantitative structural characterization from a STEM micrograph.

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Matias Nordin, Christoffer Abrahamsson, Charlotte Hamngren Blomqvist, Magnus Röding, Eva Olsson, Magnus Nydén, Mats Rudemo. 2013-08-27. Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs. https://arxiv.org/abs/1308.5958

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