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arXiv · 1402.4218

Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM

Wenpei Gao·Jianbo Wu·Xiaofeng Zhang·Aram Yoon·J. Mabon·W. Swiech·W. L. Wilson·H. Yang·Jian-Min Zuo
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Abstract

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas environments close to materials real operational conditions. Structural transformations are observed by recording images or diffraction patterns at various time intervals using a video camera or by taking snap shots using electron pulses. While time resolution at 15 ns has been reported using pulsed electron beams, the time interval that can be recorded by this technique is currently very limited. For longer recording, however, time resolution inside ETEM has been limited by electron cameras to ~1/30 seconds for a long time. Using the recently developed direct electron detection technology, we have significantly improved the time resolution of ETEM to 2.5 ms (milliseconds) for full frame or 0.625 ms for 0.25 frames.

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Wenpei Gao, Jianbo Wu, Xiaofeng Zhang, Aram Yoon, J. Mabon, W. Swiech, W. L. Wilson, H. Yang, Jian-Min Zuo. 2014-02-18. Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM. https://doi.org/10.1017/s1431927614009684

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