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arXiv · 1403.1469

Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Point

Wei Bu·Doseok Kim·David Vaknin
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Abstract

We examine the applicability of various model profiles for the liquid/vapor interface by X-ray reflectivities on water and ethanol and their mixtures at room temperature. Analysis of the X-ray reflecivities using various density profiles shows an error-function like profile is the most adequate within experimental error. Our finding, together with recent observations from simulation studies on liquid surfaces, strongly suggest that the capillary-wave dynamics shapes the interfacial density profile in terms of the error function.

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Wei Bu, Doseok Kim, David Vaknin. 2014-04-28. Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Point. https://arxiv.org/abs/1403.1469

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