Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions

V. P. Ovsyannikov

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arXiv · 1403.2168

Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions

V. P. Ovsyannikov

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Abstract

It is proposed to produce the highly charged ions in the local ion trap formed by a rippling electron beam in the focusing magnetic field. The experimental results demonstrate the presence of iridium ions with charges up to 50+. According to estimates, the average electron current density in the local ion trap can reach the value of the order of 10 kA/cm^2. The pilot examples of devices of this type with the electron beam energies within the range 3-10 keV are also presented.

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V. P. Ovsyannikov. 2014-03-10. Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions. https://arxiv.org/abs/1403.2168

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