Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface

Mohammed Humed Yusuf; Bent Nielsen; Matthew Dawber; Xu Du

doi:10.1021/nl502669v

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arXiv · 1408.6169

Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface

Mohammed Humed Yusuf·Bent Nielsen·Matthew Dawber·Xu Du

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Abstract

The interface between graphene and the ferroelectric superlattice $\mathrm{PbTiO_3/SrTiO_3}$ (PTO/STO) is studied. Tuning the transition temperature through the PTO/STO volume fraction minimizes the adsorbates at the graphene-ferroelectric interface, allowing robust ferroelectric hysteresis to be demonstrated. Intrinsic charge traps from the ferroelectric surface defects can adversely affect the graphene channel hysteresis, and can be controlled by careful sample processing, enabling systematic study of the charge trapping mechanism.

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Mohammed Humed Yusuf, Bent Nielsen, Matthew Dawber, Xu Du. 2014-08-26. Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface. https://doi.org/10.1021/nl502669v

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