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arXiv · 1412.4087

Non-Resonant Thermal Admittance Spectroscopy

Deniz Bozyigit·Vanessa Wood
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Abstract

Thermal Admittance Spectroscopy (TAS) as become a popular technique to determine trap state density and energetic position in semiconductors. In the limit of a large number of trap states ($>10^{16} \text{cm}^{-3}$), Fermi-level pinning undermines the assumptions used in the analysis of TAS data, which leads to a significant underestimation of the trap state density. Here, we develop the tools to detect and account for the occurrence of Fermi-level pinning in TAS measurements.

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Deniz Bozyigit, Vanessa Wood. 2014-12-12. Non-Resonant Thermal Admittance Spectroscopy. https://arxiv.org/abs/1412.4087

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