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arXiv · 1502.07519

Electric-field induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111)

Lukas Gerhard·Moritz Peter·Wulf Wulfhekel
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Abstract

We present a detailed study of an electric-field induced phase transition of a single layer of Fe on a Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and to follow the transition from face-centered cubic to hexagonal closepacked stacking with atomic resolution.

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Lukas Gerhard, Moritz Peter, Wulf Wulfhekel. 2015-02-26. Electric-field induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111). https://doi.org/10.1103/physrevb.91.184107

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