Low temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits

Alexander L. Burin; Moshe Schechter; Shlomi Matityahu

doi:10.1103/physrevb.92.174201

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arXiv · 1503.02646

Low temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits

Alexander L. Burin·Moshe Schechter·Shlomi Matityahu

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Abstract

The accurate analytical solution for the low temperature $1/f$ noise in a microwave dielectric constant of amorphous films containing tunneling two-level systems (TLSs) is derived within the standard tunneling model including the weak dipolar or elastic TLS-TLS interactions. The results are consistent with the recent experimental investigations of $1/f$ noise in Josephson junction qubits including the power law increase of the noise amplitude with decreasing temperature at low temperatures $T<0.1$K. The long time correlations needed for $1/f$ noise are provided by the logarithmic broadening of TLS absorption resonances with time due to their interaction with neighboring TLSs. The noise behavior at higher temperatures $T>0.1$K and its possible sensitivity to quasi-particle excitations are discussed.

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Alexander L. Burin, Moshe Schechter, Shlomi Matityahu. 2015-03-09. Low temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits. https://doi.org/10.1103/physrevb.92.174201

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