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arXiv · 1505.07530

Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence

Xue-Peng Sun·Zhi-Guo Liu·Tian-Xi Sun·Song Peng·Wei-Yuan Sun·Fang-Zuo Li·Bo-Wen Jiang·Yong-Zhong Ma·Xun-Liang Ding
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Abstract

In order to validate that the confocal X-ray fluorescence had potential applications in analyzing the intermediately and infinitely thick samples with thin sample approach without sample preparations, as an example, the confocal X-ray fluorescence based on polycapillary X-ray optics was used to analyze multi elements solutions.

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Xue-Peng Sun, Zhi-Guo Liu, Tian-Xi Sun, Song Peng, Wei-Yuan Sun, Fang-Zuo Li, Bo-Wen Jiang, Yong-Zhong Ma, Xun-Liang Ding. 2015-05-28. Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence. https://arxiv.org/abs/1505.07530

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