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arXiv · 1509.01251

Spin-mediated dissipation and frequency shifts of a cantilever at milliKelvin temperatures

A. M. J. den Haan·J. J. T. Wagenaar·J. M. de Voogd·G. Koning·T. H. Oosterkamp
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Abstract

We measure the dissipation and frequency shift of a magnetically coupled cantilever in the vicinity of a silicon chip, down to $25$ mK. The dissipation and frequency shift originates from the interaction with the unpaired electrons, associated with the dangling bonds in the native oxide layer of the silicon, which form a two dimensional system of electron spins. We approach the sample with a $3.43$ $μ$m-diameter magnetic particle attached to an ultrasoft cantilever, and measure the frequency shift and quality factor as a function of temperature and the distance. Using a recent theoretical analysis [J. M. de Voogd et al., arXiv:1508.07972 (2015)] of the dynamics of a system consisting of a spin and a magnetic resonator, we are able to fit the data and extract the relaxation time $T_1=0.39\pm0.08$ ms and spin density $σ=0.14\pm0.01$ spins per nm$^2$. Our analysis shows that at temperatures $\leq500$ mK magnetic dissipation is an important source of non-contact friction.

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A. M. J. den Haan, J. J. T. Wagenaar, J. M. de Voogd, G. Koning, T. H. Oosterkamp. 2016-01-21. Spin-mediated dissipation and frequency shifts of a cantilever at milliKelvin temperatures. https://doi.org/10.1103/physrevb.92.235441

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