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arXiv · 1510.07014

Optical properties of PZT thin films deposited on a ZnO buffer layer

T Schneider·D Leduc·J. Cardin·C Lupi·N Barreau·H Gundel
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Abstract

The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide.

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T Schneider, D Leduc, J. Cardin, C Lupi, N Barreau, H Gundel. 2015-10-23. Optical properties of PZT thin films deposited on a ZnO buffer layer. https://doi.org/10.1016/j.optmat.2006.10.015

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