Structural Semiconductor-to-Semimetal Phase Transition in Two-Dimensional Materials Induced by Electrostatic Gating

Abstract

Dynamic control of conductivity and optical properties via atomic structure changes is of tremendous technological importance in information storage. Energy consumption considerations provide a driving force toward employing thin materials in devices. Monolayer transition metal dichalcogenides are nearly atomically-thin materials that can exist in multiple crystal structures, each with distinct electrical properties. Using density functional approaches, we discover that electrostatic gating device configurations have the potential to drive structural semiconductor-to-semimetal phase transitions in some monolayer transition metal dichalcogenides. For the first time, we show that the dynamical control of this phase transition can be achieved in carefully designed electronic devices. We discover that the semiconductor-to-semimetal phase transition in monolayer MoTe2 can be driven by a gate voltage of several Volts with appropriate choice of dielectric. Structural transitions in monolayer TaSe2 are predicted to occur under similar conditions. While the required field magnitudes are large for these two materials, we find that the gate voltage for the transition can be reduced arbitrarily by alloying, e.g. for MoxW1-xTe2 monolayers. We have developed a method for computing phase diagrams of monolayer materials with respect to charge and voltage, validated by comparing to direct calculations and experimental measurements. Our findings identify a new physical mechanism, not existing in bulk materials, to dynamically control structural phase transitions in two-dimensional materials, enabling potential applications in phase-change electronic devices.