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arXiv · 1604.04407

An Anomalous Contrast of Insulators in Scanning Electron Microscope: The Split Image

Lilin Xie·Xiaona Zhang
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Abstract

A novel phenomenon of anomalous contrast in scanning electron microscope when the instrument is used to observe an insulator specimen with a wolfram probe, we called double imaging, is reported in this article. We give a detail analysis of this phenomenon in its occurrence, and discuss the influence of the added probe to internal electric field which lead to the occurrence of double imaging.

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Lilin Xie, Xiaona Zhang. 2016-04-15. An Anomalous Contrast of Insulators in Scanning Electron Microscope: The Split Image. https://arxiv.org/abs/1604.04407

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