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arXiv · 1605.04937

Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model

Maxime Debiossac·Asier Zugarramurdi·Zhao Mu·Petru Lunca-Popa·Andrew Mayne·Philippe Roncin
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Abstract

The Moir\'{e} structure of epitaxial graphene mono layer grown on 6H-SiC(0001) has been investigated recently by grazing incidence fast atom diffraction, and the results were compared with the calculation of the structure \textit{ab initio} and exact diffraction codes. We review these results and present a complementary approach using the Hard Wall Model to extract information without any \textit{a priori}. Reversely, taking advantage of previous exact calculations we evaluate quantitatively the performance of this simplified approach by comparing predictions using the same potential energy surface.

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Maxime Debiossac, Asier Zugarramurdi, Zhao Mu, Petru Lunca-Popa, Andrew Mayne, Philippe Roncin. 2016-02-22. Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model. https://doi.org/10.1103/physrevb.94.205403

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