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arXiv · 1612.00753

Characterization of YbNi$_4$(P$_{1-{\it x}}$As$_{\it x}$)$_2$, $x = 0, 0.2$ single crystals grown by Czochralski method

Kristin Kliemt·Cornelius Krellner
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Abstract

We have investigated large single crystals of YbNi$_4$P$_2$ that were grown from a levitating melt by the Czochralski method. The new samples facilitate the determination of the absolute values of the electrical resistivity. Phase pure polycrystalline samples of the non-magnetic reference LuNi$_4$P$_2$ were prepared and the electrical resistivity was measured. Furthermore we have grown a single crystal of the As substituted compound YbNi$_4$(P$_{1-{\it x}}$As$_{\it x}$)$_2$, $x = 0.2$ and investigated the homogenity of the As distribution.

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Kristin Kliemt, Cornelius Krellner. 2016-12-02. Characterization of YbNi$_4$(P$_{1-{\it x}}$As$_{\it x}$)$_2$, $x = 0, 0.2$ single crystals grown by Czochralski method. https://doi.org/10.1088/1742-6596/807/3/032005

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