Josephson radiation and shot noise of a semiconductor nanowire junction

David J. van Woerkom; Alex Proutski; Ruben J. J. van Gulik; Tamás Kriváchy; Diana Car; Sèbastian R. Plissard; Erik P. A. M. Bakkers; Leo P. Kouwenhoven; Attila Geresdi

doi:10.1103/physrevb.96.094508

arXiv · 1702.02804

Josephson radiation and shot noise of a semiconductor nanowire junction

David J. van Woerkom·Alex Proutski·Ruben J. J. van Gulik·Tamás Kriváchy·Diana Car·Sèbastian R. Plissard·Erik P. A. M. Bakkers·Leo P. Kouwenhoven·Attila Geresdi

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Abstract

We measured the Josephson radiation emitted by an InSb semiconductor nanowire junction utilizing photon assisted quasiparticle tunneling in an AC-coupled superconducting tunnel junction. We quantify the action of the local microwave environment by evaluating the frequency dependence of the inelastic Cooper-pair tunneling of the nanowire junction and find the zero frequency impedance $Z(0)=492\,Ω$ with a cutoff frequency of $f_0=33.1\,$GHz. We extract a circuit coupling efficiency of $η\approx 0.1$ and a detector quantum efficiency approaching unity in the high frequency limit. In addition to the Josephson radiation, we identify a shot-noise contribution with a Fano factor $F\approx1$, consistently with the presence of single electron states in the nanowire channel.

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David J. van Woerkom, Alex Proutski, Ruben J. J. van Gulik, Tamás Kriváchy, Diana Car, Sèbastian R. Plissard, Erik P. A. M. Bakkers, Leo P. Kouwenhoven, Attila Geresdi. 2017-10-21. Josephson radiation and shot noise of a semiconductor nanowire junction. https://doi.org/10.1103/physrevb.96.094508

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