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arXiv · 1802.05660

Fidelity based Measurement Induced Nonlocality over two-sided measurements

R. Muthuganesan·R. Sankaranarayanan
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Abstract

In this paper, we introduce quantum fidelity based measurement induced nonlocality for the bipartite state over two-sided von Neumann projective measurements. While all the properties of this quantity are reflected from that of one-sided measurement, the latter one is shown to set an upper bound for arbitrary bipartite state. As an illustration, we have studied the nonlocality of Bell diagonal state.

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R. Muthuganesan, R. Sankaranarayanan. 2018-02-15. Fidelity based Measurement Induced Nonlocality over two-sided measurements. https://doi.org/10.1142/s0219749918500545

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